BLOG >> DEEP Model [2.0]
Smarter iPhone Diagnostics
Traditional iPhone diagnostics use only PANIC logs. DEEP Model 2.0 combines PANIC and system logs for faster, more accurate fault detection—no disassembly needed.Try it now
Why Combine Logs?
| Log Type | Purpose | What It Reveals |
|---|---|---|
| PANIC | Crash trigger | Initial error causing reboot |
| STACKS | Execution path | Code/hardware trace at crash |
| JETSAM | Memory management | RAM pressure and app/resource failures |
| THERMAL/BATTERY/DIAG | Device health | Overheating or power anomalies |
| IO-AGGREGATED | Storage & I/O | NAND or PMIC access errors |
| BRIDGEOS | Co-processor logs | T2 chip or Secure Enclave issues |
| BASEBAND | Modem activity | Signal, modem, or SIM faults |
Key Benefits of DEEP Model 2.0
- Smarter fault detection: Get insights based on full-system behavior, not just one crash log.
- Save technician time: Pinpoint issues faster — even before disassembly.
- Reduce guesswork: Use clear log patterns and correlation to isolate faulty components.
- Boost repair success: Fewer misdiagnoses and return visits.
Combined Log Analysis – Diagnostic Benefits
| PANIC Log (Initial Clue) | With Other Relevant Logs | Faulty Component Identified |
|---|---|---|
| userspace watchdog timeout | STACKS shows last running thread in `powerd` | Power IC (PMIC) or battery connector |
| sep panic: watchdog timeout | BRIDGEOS logs reveal Secure Enclave reboot loops | T2/Secure Enclave chip |
| applelogo panic: no successful checkins | IO-AGGREGATED shows NAND access errors | NAND (storage) or PMU |
| baseband crash | BASEBAND logs show missing signal registration | Baseband chip / RF path |
| Missing sensor(s) | THERMAL logs show no temperature readings from one zone | Temperature sensor line or power rail |
| Kernel panic due to memory pressure | JETSAM logs show repeated RAM pressure events | RAM module or CPU RAM management |
| watchdog: no successful checkins | STACKS shows I/O hangs in `thermalmonitord` | Charging IC or I2C sensors |
How It Works
- Upload the PANIC log.
- Based on the panic data, the system will prompt you to upload additional relevant logs.
- Click Analyze Logs to run deep fault detection across all inputs.
DEEP Model 2.0 is a work in progress — but it's already transforming iPhone diagnostics.