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BIM - DEEP Model 2.0
Smarter iPhone Diagnostics
Traditional iPhone diagnostic tools rely solely on PANIC logs to identify hardware issues. But hardware failures are complex — and a single log often tells only part of the story.DEEP Model 2.0 changes that. It combines PANIC logs with additional system logs to provide more complete and accurate fault recognition — before opening the device.
Why Combine Logs?
| Log Type | Purpose | What It Reveals |
|---|---|---|
| PANIC | Crash trigger | Initial error causing reboot |
| STACKS | Execution path | Code/hardware trace at crash |
| JETSAM | Memory management | RAM pressure and app/resource failures |
| THERMAL/BATTERY/DIAG | Device health | Overheating or power anomalies |
| IO-AGGREGATED | Storage & I/O | NAND or PMIC access errors |
| BRIDGEOS | Co-processor logs | T2 chip or Secure Enclave issues |
| BASEBAND | Modem activity | Signal, modem, or SIM faults |
Key Benefits of DEEP Model 2.0
- Smarter fault detection: Get insights based on full-system behavior, not just one crash log.
- Save technician time: Pinpoint issues faster — even before disassembly.
- Reduce guesswork: Use clear log patterns and correlation to isolate faulty components.
- Boost repair success: Fewer misdiagnoses and return visits.
Combined Log Analysis – Diagnostic Benefits
| PANIC Log (Initial Clue) | With Other Relevant Logs | Faulty Component Identified |
|---|---|---|
| userspace watchdog timeout | STACKS shows last running thread in `powerd` | Power IC (PMIC) or battery connector |
| sep panic: watchdog timeout | BRIDGEOS logs reveal Secure Enclave reboot loops | T2/Secure Enclave chip |
| applelogo panic: no successful checkins | IO-AGGREGATED shows NAND access errors | NAND (storage) or PMU |
| baseband crash | BASEBAND logs show missing signal registration | Baseband chip / RF path |
| Missing sensor(s) | THERMAL logs show no temperature readings from one zone | Temperature sensor line or power rail |
| Kernel panic due to memory pressure | JETSAM logs show repeated RAM pressure events | RAM module or CPU RAM management |
| watchdog: no successful checkins | STACKS shows I/O hangs in `thermalmonitord` | Charging IC or I2C sensors |
How It Works
- Upload the PANIC log.
- Based on the panic data, the system will prompt you to upload additional relevant logs.
- Click Analyze Logs to run deep fault detection across all inputs.
DEEP Model 2.0 is a work in progress — but it's already transforming iPhone diagnostics.